Belle II SVD ladder assembly procedure and electrical qualification
Belle II実験SVD検出器のladder組み立て手順と電気的品質管理について
Adamczyk, K.*; 谷田 聖; 他94名*
Adamczyk, K.*; Tanida, Kiyoshi; 94 of others*
The Belle II experiment at the SuperKEKB asymmetric $$e^+e^-$$ collider in Japan will operate at a luminosity approximately 50 times larger than its predecessor (Belle). At its heart lies a six-layer vertex detector comprising two layers of pixelated silicon detectors (PXD) and four layers of double-sided silicon microstrip detectors (SVD). One of the key measurements for Belle II is time-dependent CP violation asymmetry, which hinges on a precise charged-track vertex determination. Towards this goal, a proper assembly of the SVD components with precise alignment ought to be performed and the geometrical tolerances should be checked to fall within the design limits. We present an overview of the assembly procedure that is being followed, which includes the precision gluing of the SVD module components, wire-bonding of the various electrical components, and precision three dimensional coordinate measurements of the jigs used in assembly as well as of the final SVD modules.
使用言語 : English
掲載資料名 : Nuclear Instruments and Methods in Physics Research A
: 824
:
ページ数 : p.381 - 383
発行年月 : 2016/07
出版社名 : Elsevier
発表会議名 : 13th Pisa Meeting on Advanced Detectors
開催年月 : 2015/05
開催都市 : La Biodola
開催国 : Italy
特許データ :
PDF :
論文URL :
キーワード : シリコンバーテックス検出器
使用施設 :
広報プレスリリース :
論文解説記事
(成果普及情報誌)
:
受委託・共同研究相手機関 : 高エネルギー加速器研究機構
 
登録番号 : BB20161374
抄録集掲載番号 : 45000034
論文投稿番号 : 18370
Accesses  (From Jun. 2, 2014)
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パーセンタイル:100
分野:Instruments & Instrumentation
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