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模擬廃棄物含有リン添加ホウケイ酸ガラス試料のXAFS測定(共同研究)

XAFS measurement of simulated waste glass samples prepared from borosilicate glass frit including phosphorus pentaoxide (Joint research)

永井 崇之; 小林 秀和; 嶋村 圭介; 大山 孝一; 捧 賢一; 岡本 芳浩; 塩飽 秀啓; 山中 恵介*; 太田 俊明*

Nagai, Takayuki; Kobayashi, Hidekazu; Shimamura, Keisuke; Oyama, Koichi; Sasage, Kenichi; Okamoto, Yoshihiro; Shiwaku, Hideaki; Yamanaka, Keisuke*; Ota, Toshiaki*

ガラス固化プロセスで製造されるガラス固化体中の原料ガラス成分や廃棄物成分の局所構造は、固化体に含まれる廃棄物成分による影響を受ける。本研究は、リン添加ホウケイ酸ガラスを原料ガラスに用いて模擬廃棄物ガラス試料を作製し、放射光XAFS測定によりガラス成分の軽元素や廃棄物成分の希土類元素等の化学状態及び局所構造を評価した。

Addition of radioactive waste to a borosilicate glass frit affects the local structures of glass-forming elements and waste elements in a waste glass produced in a vitrification process. In this study, simulated waste glass samples were prepared from borosilicate glass frit including phosphorus pentaoxide, and we investigated local structures of sodium (Na), boron (B), and waste elements in these glass samples by using synchrotron XAFS measurements in soft and hard X ray region.

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